Supplies / ZEISS accessories
Pallet systems
With pallets, parts can be fixtured before measurement, away from the machine—boosting productivity.
Content aligned with the previous AMS pallet systems page; editorial tweaks may follow.
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Pallets and clamping pallets
ZEISS pallet systems can significantly increase measuring-machine efficiency: while one workpiece is measured, the next is prepared on another pallet. Pallets can be exchanged in seconds and aligned for measurement without repositioning the part. Grid plates are also available for secure fixturing on the CMM—using modular ZEISS system components.
Optical
The ZEISS OMEGA pallet system is designed for O-INSPECT, O-DETECT, and O-SELECT optical measuring instruments. Pallets are available with a smooth surface—glass for transmitted-light measurement—or black anodized with perforated grids suited to your own projects and thread sizes.
Tactile
The ZEISS THETA pallet system suits tactile gantries and production measuring equipment. Pallets are available with or without hole grids, with hole patterns in different sizes and layouts—so you can adapt your own configurations with ease.
Tomographic
The ZEISS GAMMA pallet system fixtures components on ZEISS METROTOM or VoluMax industrial CT. To use the full Z measuring range, we offer multi-level tower systems or lifting tables.